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Additive and Traditionally Manufactured Components. A Comparative Analysis of Mechanical Properties

  • Book

  • April 2020
  • Elsevier Science and Technology
  • ID: 4858577

Additive and Traditionally Manufactured Components: A Comparative Analysis of Mechanical Properties looks at the mechanical properties of materials produced by additive manufacturing (AM) and compares them with conventional methods. Since the production of objects by AM techniques can used in a broad array of materials, the alloys presented are the ones most commonly produced by AM - Al alloys, Ti alloys and steel. The book explores the six main types of techniques: Fused Deposition Method (FDM), Powder Bed Fusion (PBF), Inkjet Printing, Stereolithography (SLA), Direct Energy Deposition (DED) and Laminated Object Manufacturing (LOM), and follows with the techniques being utilized for fabrication.

Testing of AM fabricated specimens, including tension, compression and hardness is included, along with a comparison of those results to specimens obtained by conventional fabrication methods. Topics covered include static deformation, time dependent deformation (creep), cyclic deformation (fatigue) and fracture in specimens. The book concludes with a review of the mechanical properties of nanoscale specimens obtained by AM.

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Table of Contents

1. What is additive manufacturing?2. Fabrication3. Testing: Comparison of AM data with traditionally fabricated4. Dislocations in AM and traditional manufacturing: A comparison5. Deformation in AM and traditional manufacturing: A comparison6. Dynamic deformation7. Time-dependent deformation creep in AM and traditional manufacturing8. Cyclic deformation (fatigue) in AM and traditional manufacturing: A comparison9. Fracture in AM and traditional manufactured components10. Comparison of deformation in AM and CP nanomaterials11. Epilogue

Authors

Joshua Pelleg Professor, Materials Engineering, Ben Gurion University, Israel. Joshua Pelleg received his B.Sc. in Chemical Engineering at the Technion - Institute of Technology, Haifa, Israel; a M.Sc. in Metallurgy at the Illinois Institute of Technology, Chicago, IL and a Ph.D. in Metallurgy at the University of Wisconsin, Madison, WI. He has been in the Ben-Gurion University of the Negev (BGU) Materials Engineering Department in Beer-Sheva, Israel since 1970, and was among the founders of the department, and served as its second chairman. Professor Pelleg was the recipient of the Samuel Ayrton Chair in Metallurgy. He specializes in the mechanical properties of materials and the diffusion and defects in solids. He has chaired several university committees and served four terms as the Chairman of Advanced Studies at Ben-Gurion University of the Negev. Prior to his work at BGU, Pelleg acted as Assistant Professor and then Associate Professor in the Department of Materials and Metallurgy at the University of Kansas, Lawrence, KS. Professor Pelleg was also a Visiting Professor: in the Department of Metallurgy at Iowa State University; at the Institute for Atomic Research, US Atomic Energy Commission, Ames, IA; at McGill University, Montreal, QC; at the Tokyo Institute of Technology, Applied Electronics Department, Yokohama, Japan; and in Curtin University, Department of Physics, Perth, Australia. His non-academic research and industrial experience includes: Chief Metallurgist in Urdan Metallurgical Works Ltd., Netanyah, Israel; Research Engineer in International Harvester Manufacturing Research, Chicago, IL; Associate Research Officer for the National Research Council of Canada, Structures and Materials, National Aeronautical Establishment, Ottawa, ON; Physics Senior Research Scientist, Nuclear Research Center, Beer-Sheva, Israel; Materials Science Division, Argonne National Labs, Argonne, IL; Atomic Energy of Canada, Chalk River, ON; Visiting Scientist, CSIR, National Accelerator Centre, Van de Graaf Group Faure, South Africa; Bell Laboratories, Murray Hill, NJ; and GTE Laboratories, Waltham, MA. His current research interests are diffusion in solids, thin film deposition and properties (mostly by sputtering) and the characterization of thin films, among them various silicides.