Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting, Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
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Table of Contents
1. IntroductionSandra Van Aert
2. Statistical parameter estimation theory
Sandra Van Aert
3. Efficient fitting algorithm
Sandra Van Aert
4. Statistics-based atom counting
Sandra Van Aert
5. Atom column detection
Sandra Van Aert
6. Optimal experiment design for nanoparticle atom-counting from ADF STEM images
Sandra Van Aert
7. Maximum a posteriori probability
Sandra Van Aert
8. Discussion and conclusions
Sandra Van Aert
9. Phase retrieval methods applied to coherent imaging
Tatiana Latychevskaia
