Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.
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Table of Contents
Preface Martin H?tch and Peter W. Hawkes 1. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia 2. X-ray phase-contrast imaging: a broad overview of some fundamentals David M. Paganin and Daniele Pelliccia 3. Graphyne and borophene as nanoscopic materials for electronicswith review of the physics C. M. Krowne 4. The ESAB effect and the physical meaning of the vector potential R. Carles, O. Pujol, and J.-Ph. Perez 5. Electron image plane off-axis holography of atomic structures Hannes Lichte
