A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful, accurate results. Sections describe the theoretical aspects of methods and applications, emphasizing a practical approach, including advantages and limitations. The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis, including aspects like samples, sample handling and quantification. Key case studies emphasizing the strength of the method are included. The book also explains the calibration of instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation.
This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.
Table of Contents
PART I: The Method1. Theoretical Background2. TXRF Instrumentation for different energy ranges and Experimental 3. ParametersAnalyzing Samples using TXRFSamples and sample preparation Sample presentation and instrumental parameters4. Validation and Performance of TXRF5. Performance of TXRF and Comparison to other Methods6. Related Methods to TXRF
PART II: APPLICATIONS7. Geological and Environmental Applications8. Clinical, Medical, and Biological Applications9. Food and Beverages10. Cultural Heritage11. Chemical, Pharmaceutical, and Petrochemical Applications12. Advanced Nanomaterials and Industrial Application13. Energy related materials, and Industrial Applications
Part III: CONCLUSIONSTXRF checklist
Part IV: INDEXES