Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Table of Contents
1. INTRODUCTIONGerrit Hermanus Jansen
2. HISTORICAL NOTES
Gerrit Hermanus Jansen
3. GENERAL BEAM PROPERTIES
Gerrit Hermanus Jansen
4. THE MANY BODY PROBLEM OF PARTICLES INTERACTING THROUGH AN INVERSE SQUARE FORCE LAW
Gerrit Hermanus Jansen
5. CONCEPTS OF AN ANALYTICAL MODEL FOR STATISTICAL INTERACTIONS IN PARTICLE BEAMS
Gerrit Hermanus Jansen
6. TWO PARTICLE DYNAMICS
Gerrit Hermanus Jansen
7. BOERSCH EFFECT
Gerrit Hermanus Jansen
8. STATISTICAL ANGULAR DEFLECTIONS
Gerrit Hermanus Jansen
9. TRAJECTORY DISPLACEMENT EFFECT
Gerrit Hermanus Jansen
10. FURTHER INVESTIGATIONS ON STATISTICAL INTERACTIONS
Gerrit Hermanus Jansen
11. SPACE CHARGE EFFECT IN LOW DENSITY PARTICLE BEAMS
Gerrit Hermanus Jansen
12. CALCULATION OF DIFFERENT SPOT- AND EDGE-WIDTH MEASURES
Gerrit Hermanus Jansen
13. MONTE CARLO SIMULATION OF PARTICLE BEAMS
Gerrit Hermanus Jansen
14. COMPARISON OF ANALYTICAL RESULTS WITH MONTE CARLO SIMULATIONS
Gerrit Hermanus Jansen
15. COMPARISON OF RECENT THEORIES ON STATISTICAL INTERACTIONS
Gerrit Hermanus Jansen
16. SUMMARY FOR THE ONE-MINUTE DESIGNER
Gerrit Hermanus Janse