The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.
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Table of Contents
Foreword Peter W. Hawkes Foreword to first edition Peter W. Hawkes Preface by Ernst Ruska Ernst Ruska and Peter Hawkes (Afterword) 1. Recollections from the early years: Canada-USA Cecil E. Hall and Peter Hawkes (Afterword) 2. My recollection of the early history of our work on electron optics and the electron microscope Tadatosi Hibi and Peter Hawkes (Afterword) 3. Walter Hoppe-X-ray crystallographer and visionary pioneer in electron microscopy Joachim Frank 4. Reminiscences of the development of electron optics and electron microscope instrumentation in Japan Koichi Kanaya and Peter Hawkes (Afterword) 5. Early electron microscopy in the Netherlands J.B. Le Poole and Pieter Kruit (Afterword) 6. L. L. Marton, 1901-1979 Charles S?sskind and Peter Hawkes (Afterword) 7. The invention of the electron Fresnel interference biprism G. M?llenstedt and Peter Hawkes (Afterword) 8. The industrial development of the electron microscope by the Metropolitan Vickers Electrical Company and AEI Limited T. Mulvey and Peter Hawkes (Afterword)) 9. The development of the scanning electron microscope C.W. Oatley, D. McMullan, K.C.A. Smith, and Peter Hawkes (Afterword) 10. Some recollections of electron microscopy in Britain from 1943 to 1948 R. Reed and Peter Hawkes (Afterword) 11. Rudolf R?hle and the BOSCH electron microscope: another early commercial instrument Hans R. Gelderblom and Heinz Schwarz 12. Otto Scherzer and his contributions to electron microscopy Dieter Typke 13. 1950-1960: a decade from the viewpoint of an applications laboratory Cilly Weichan and Maren Heinzerling (Afterword) 14. From the cathode-ray oscillograph to the high-resolution electron microscope Otto Wolff and Peter Hawkes (Afterword) 15. Reminiscences R.W.G. Wyckoff and Peter Hawkes (Afterword) 16. Complementary accounts of the history of electron microscopy Peter Hawkes
Authors
Peter W. Hawkes Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Martin H�tch Senior Scientist, French National Centre for Research (CNRS), Toulouse, France.
Dr Martin H�tch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP)�, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM)�, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
